Fix JTAG sanity check in BYPASS device counting

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Detailed description

• This is not a new feature.
• The existing problem is an error triggered in BMD logic for chips which are debuggable by OpenOCD using same adapteres.
• The PR solves it by ensuring DR value is predictable.

jtag_scan: Sanity check failed: BYPASS dev count doesn't match IR scan
Not tested yet. The error/warning demotion will be rebased away once I confirm the solution works.

Your checklist for this pull request

• I've read the Code of Conduct
• I've read the guidelines for contributing to this repository
• It builds for hardware native (see Building the firmware)
• It builds as BMDA (see Building the BMDA)
• I've tested it to the best of my ability
• My commit messages provide a useful short description of what the commits do

Closing issues